Sheetal Kaul has earned the 2025 Global Recognition Award for her groundbreaking contributions to semiconductor engineering, particularly on one of Intel’s newest platforms. Her leadership in the On-Die Low Voltage Regulator (LVR) project set new industry benchmarks for silicon-level innovation, addressing critical chip manufacturing and debugging challenges. Kaul’s work exemplifies excellence across engineering, leadership, and research, showcasing a mastery that continues to shape next-generation semiconductor design.

Technical Innovation and Engineering Excellence

Kaul’s leadership in the On-Die LVR project led to a breakthrough JTAG survivability solution, ensuring continuous programming access even during system failures. She strategically repurposed JTAG clocks for high-volume manufacturing testing and maintained register accessibility while optimizing area and power efficiency. Her mastery of analog-digital interactions under extreme constraints showcases rare engineering expertise.

Her technical contributions extend to advanced IP isolation mechanisms that stabilize bandgap references during system resets and power-downs. She pioneered DFX probing solutions for high-speed signal monitoring, setting new semiconductor debugging benchmarks. Kaul transformed complex architectural challenges into scalable, high-impact solutions through her specialized SCAN strategy and end-to-end oversight from specification to validation.

Leadership and Cross-Functional Impact

Kaul showcased exceptional leadership in the On-Die LVR project by driving innovative solutions and maintaining rigorous code review standards under tight deadlines. Her strategic execution ensured timing convergence and efficient partitioning across the newest process node, effectively managing cross-functional teams spanning validation and back-end engineering.

Beyond technical excellence, her work delivered a measurable business impact, with DFX implementations significantly reducing Defects Per Million rates and saving the company millions in manufacturing costs. Widely recognized as a go-to expert for high-risk projects, Kaul’s ON-DIE LVR solution now serves as a blueprint for future survivability and scan implementations, influencing industry standards and best practices.

Research and Innovation Excellence

Kaul’s research demonstrates exceptional originality, particularly in developing novel JTAG-based configurability solutions that enhance semiconductor testing and debugging. Her interdisciplinary approach—spanning analog-digital integration, system architecture, and manufacturing optimization—delivers impactful real-world applications, improving efficiency and reliability.

Her innovative methodologies have reshaped SoC design, introducing new survivability and scan implementation strategies that challenge conventional debugging techniques. Widespread adoption and positive feedback within the company validate the practical value of her contributions. Her commitment to knowledge sharing through publications and technical documentation further cements her role in advancing semiconductor engineering standards.

Final Words

Kaul’s 2025 Global Recognition Award honors her ability to deliver scalable, cost-effective semiconductor solutions. Her contributions to the company’s latest platform drive innovation, business impact, and advancement of industry standards.

Beyond individual and technical achievements, she has shaped best practices for testability and debug mechanisms, influencing future developments. Her expertise, leadership, and commitment to excellence make her a deserving recipient.